Part Number
Part Number:
NSN:
NIIN:
Item Name:
CHASSIS , PLUG-IN UNIT , ELECTRONIC
Definition:
AN OPEN FRAMEWORK DESIGNED FOR PLUG-IN MOUNTING OF (BUT DOES NOT INCLUDE) MODULAR ELECTRONIC TEST INSTRUMENTS. MAY PROVIDE POWER SUPPLY, ELECTRICAL AND/OR MECHANICAL INTERFACE, OR COOLING FACILITIES FOR EACH ELECTRONIC TEST PLUG-IN UNIT SLOT. ENTIRE CHASSIS MAY BE RACK MOUNTED. FOR MOUNTING OF ELECTRICAL COMPONENTS OTHER THAN MODULAR TEST EQUIPMENT, SEE RACK, ELECTRICAL EQUIPMENT OR CHASSIS, ELECTRICAL EQUIPMENT. SEE ALSO OSCILLOSCOPE MAINFRAME.
CAGE Information
| Code | Company |
|---|---|
| 5J927 | INTERFACE TECHNOLOGY INC |
Federal Supply Class
Title
ELECTRICAL AND ELECTRONIC PROPER
Inclusions:
INCLUDES TEST LEADS AND TEST LEAD ATTACHMENTS; TEST INSTRUMENTS DESIGNED FOR COMMUNICATION EQUIPMENT; TEST INSTRUMENTS DESIGNED FOR USE WITH ELECTRONIC EQUIPMENT CLASSIFIED IN TWO OR MORE FSC GROUPS.
Exclusions:
EXCLUDES RADIAC EQUIPMENT
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| SUPP | SUPPLEMENTARY FEATURES | SUPPORTS 1K-4K MEMORY I/O CARDS |
| FEAT | SPECIAL FEATURES | MFG NAME-20 MHZ PATTERN GENERATOR/ANALYZER MAINFRAME |
| APQB | UNIT TYPE | ANALYZER/PATTERN GENERATOR |
| AGAV | END ITEM IDENTIFICATION | AN/APG-68 |
| FTLD | FUNCTIONAL DESCRIPTION | HIGH SPEED PATTERN GENERATION ANDTEST CAPABILITIES VIA DUAL MICROPROCESSOR ARCHITECTURE AND MODULAR PLUG-IN I/O CARDS |