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Part Number:
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Item Name:
MICROCIRCUIT , DIGITAL

Definition:

A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".

CAGE Information

Code Company
80249 BAE SYSTEMS INFORMATION AND ELECTRON

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
AEHX MAXIMUM POWER DISSIPATION RATING 220.0 MILLIWATTS
CQSZ INCLOSURE CONFIGURATION FLAT PACK
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
ADAT BODY WIDTH 0.200 INCHES MINIMUM AND 0.300 INCHES MAXIMUM
CQZP INPUT CIRCUIT PATTERN DUAL 4 INPUT
ADAU BODY HEIGHT 0.008 INCHES MINIMUM AND 0.100 INCHES MAXIMUM
CQSJ INCLOSURE MATERIAL CERAMIC AND GLASS
CBBL FEATURES PROVIDED HERMETICALLY SEALED AND EDGE TRIGGERED AND MEDIUM SPEED AND MEDIUM POWER AND POSITIVE OUTPUTS AND MONOLITHIC AND W/CLEAR
CQWX OUTPUT LOGIC FORM TRANSISTOR-TRANSISTOR LOGIC
ADAQ BODY LENGTH 0.337 INCHES MINIMUM AND 0.350 INCHES MAXIMUM
CZEQ TIME RATING PER CHACTERISTIC 39.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 50.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
CTFT CASE OUTLINE SOURCE AND DESIGNATOR -0-004-AA JOINT ELECTRON DEVICE ENGINEERING COUNCIL
TEST TEST DATA DOCUMENT 80249-911252 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING)
CSSL DESIGN FUNCTION AND QUANTITY 2 FLIP-FLOP, J-K, CLOCKED AND 2 FLIP-FLOP, J-K, MASTER SLAVE

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