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Part Number

Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , LINEAR

Definition:

A MICROCIRCUIT WHOSE OUTPUT IS A FUNCTION OF THE INPUT; THAT IS, THE OUTPUT VARIES IN A PREDETERMINED AND ESSENTIALLY PREDICTABLE MANNER FROM THE INPUT SIGNAL.

CAGE Information

Code Company
27014 NATIONAL SEMICONDUCTOR CORPORATION

Federal Supply Class

Title

MICROCIRCUITS, ELECTRONIC

Inclusions:

INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.

Exclusions:

EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE
CQSZ INCLOSURE CONFIGURATION DUAL-IN-LINE
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
CTFT CASE OUTLINE SOURCE AND DESIGNATOR T0-116 JOINT ELECTRON DEVICE ENGINEERING COUNCIL
ADAU BODY HEIGHT 0.140 INCHES MINIMUM AND 0.180 INCHES MAXIMUM
CBBL FEATURES PROVIDED POSITIVE OUTPUTS AND MONOLITHIC AND HERMETICALLY SEALED AND HIGH SPEED
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
AEHX MAXIMUM POWER DISSIPATION RATING 750.0 MILLIWATTS
ADAT BODY WIDTH 0.220 INCHES MINIMUM AND 0.280 INCHES MAXIMUM
CQZP INPUT CIRCUIT PATTERN DUAL 4 INPUT
CQSJ INCLOSURE MATERIAL CERAMIC AND GLASS
CSSL DESIGN FUNCTION AND QUANTITY 2 DRIVER, LINE
CWSG TERMINAL SURFACE TREATMENT TIN
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
CZEQ TIME RATING PER CHACTERISTIC 12.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 18.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
ADAQ BODY LENGTH 0.660 INCHES MINIMUM AND 0.785 INCHES MAXIMUM

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