Part Number
Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL
Definition:
A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".
CAGE Information
| Code | Company |
|---|---|
| 01295 | TEXAS INSTRUMENTS INCORPORATED DBA T |
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
| AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
| PMLC | PRECIOUS MATERIAL AND LOCATION | BODY AND TERMINAL SURFACES GOLD |
| PRMT | PRECIOUS MATERIAL | GOLD |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 396.0 MILLIWATTS |
| ADAU | BODY HEIGHT | 0.035 INCHES MINIMUM AND 0.050 INCHES MAXIMUM |
| ADAQ | BODY LENGTH | 0.250 INCHES MINIMUM AND 0.260 INCHES MAXIMUM |
| CQSJ | INCLOSURE MATERIAL | GLASS AND METAL |
| CZEQ | TIME RATING PER CHACTERISTIC | 10.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 10.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| CQSZ | INCLOSURE CONFIGURATION | FLAT PACK |
| AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
| CSSL | DESIGN FUNCTION AND QUANTITY | 2 GATE, NAND |
| CQZP | INPUT CIRCUIT PATTERN | DUAL 4 INPUT |
| CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
| TEST | TEST DATA DOCUMENT | 03640-6088471 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING) |
| ADAT | BODY WIDTH | 0.140 INCHES MINIMUM AND 0.150 INCHES MAXIMUM |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND MONOLITHIC AND HIGH SPEED AND POSITIVE OUTPUTS AND W/TOTEM POLE OUTPUT AND MEDIUM POWER |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | T0-84 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |