Part Number
Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL
Definition:
A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".
CAGE Information
Code | Company |
---|---|
01295 | TEXAS INSTRUMENTS INCORPORATED DBA T |
Characteristics (Decoded)
MRC | Requirements Statement | Clear Text Reply |
---|---|---|
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
CSSL | DESIGN FUNCTION AND QUANTITY | 6 FLIP-FLOP, D-TYPE |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | MO-001AA JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
ADAT | BODY WIDTH | 0.247 INCHES MINIMUM AND 0.285 INCHES MAXIMUM |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND BURN IN AND W/CLEAR AND W/CLOCK |
CQSZ | INCLOSURE CONFIGURATION | FLAT PACK |
ADAU | BODY HEIGHT | 0.050 INCHES MINIMUM AND 0.080 INCHES MAXIMUM |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
ADAQ | BODY LENGTH | 0.371 INCHES MINIMUM AND 0.400 INCHES MAXIMUM |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 7.0 VOLTS MAXIMUM POWER SOURCE |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD |
CQZP | INPUT CIRCUIT PATTERN | 8 INPUT |
TTQY | TERMINAL TYPE AND QUANTITY | 16 FLAT LEADS |
CZEQ | TIME RATING PER CHACTERISTIC | 30.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 35.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |