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Part Number

Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL

Definition:

A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".

CAGE Information

Code Company
01295 TEXAS INSTRUMENTS INCORPORATED DBA T

Federal Supply Class

Title

MICROCIRCUITS, ELECTRONIC

Inclusions:

INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.

Exclusions:

EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
ADAQ BODY LENGTH 0.350 INCHES MAXIMUM
CQZP INPUT CIRCUIT PATTERN HEX 1 INPUT
AEHX MAXIMUM POWER DISSIPATION RATING 500.0 MILLIWATTS
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
CTFT CASE OUTLINE SOURCE AND DESIGNATOR C-2 MIL-M-38510
CSSL DESIGN FUNCTION AND QUANTITY 6 BUFFER, HEX
CQSJ INCLOSURE MATERIAL CERAMIC
CZEN VOLTAGE RATING AND TYPE PER CHARACTERISTIC 7.0 VOLTS MAXIMUM POWER SOURCE
ADAU BODY HEIGHT 0.100 INCHES MAXIMUM
CQWX OUTPUT LOGIC FORM COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
TEST TEST DATA DOCUMENT 96906-MIL-STD-883 STANDARD
CQSZ INCLOSURE CONFIGURATION LEADLESS FLAT PACK
ADAT BODY WIDTH 0.350 INCHES MAXIMUM
TTQY TERMINAL TYPE AND QUANTITY 20 LEADLESS
CWSG TERMINAL SURFACE TREATMENT SOLDER
CBBL FEATURES PROVIDED MONOLITHIC

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