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Part Number

Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL

Definition:

A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".

CAGE Information

Code Company
54485 MICROSEMI CORP.- MASSACHUSETTS DBA M

Federal Supply Class

Title

MICROCIRCUITS, ELECTRONIC

Inclusions:

INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.

Exclusions:

EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.

Characteristics (Decoded)

MRC Requirements Statement Clear Text Reply
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
AFGA OPERATING TEMP RANGE -55.0/+125.0 DEG CELSIUS
CZEN VOLTAGE RATING AND TYPE PER CHARACTERISTIC 15.0 VOLTS MAXIMUM POWER SOURCE
TTQY TERMINAL TYPE AND QUANTITY 16 PIN
AEHX MAXIMUM POWER DISSIPATION RATING 1.0 WATTS
ADAU BODY HEIGHT 0.260 INCHES MINIMUM AND 0.270 INCHES MAXIMUM
CQWX OUTPUT LOGIC FORM TRANSISTOR-DIODE-RESISTOR LOGIC
AFJQ STORAGE TEMP RANGE -65.0/+150.0 DEG CELSIUS
CQZP INPUT CIRCUIT PATTERN 1 INPUT
CBBL FEATURES PROVIDED HYBRID AND NEGATIVE OUTPUTS AND HERMETICALLY SEALED AND POSITIVE OUTPUTS
TEST TEST DATA DOCUMENT 06481-970521 DRAWING
CQSJ INCLOSURE MATERIAL METAL
CQSZ INCLOSURE CONFIGURATION CAN
CZEQ TIME RATING PER CHACTERISTIC 2000.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 2000.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
ADAR BODY OUTSIDE DIAMETER 0.598 INCHES MINIMUM AND 0.604 INCHES MAXIMUM
CSSL DESIGN FUNCTION AND QUANTITY 1 DRIVER, POWER
CWSG TERMINAL SURFACE TREATMENT SOLDER

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