Part Number
Part Number:
NSN:
NIIN:
Item Name:
MICROCIRCUIT , DIGITAL
Definition:
A MICROCIRCUIT SPECIFICALLY DESIGNED TO GENERATE, MODIFY, OR PROCESS ELECTRICAL SIGNALS WHICH OPERATE WITH TWO DISTINCT OR BINARY STATES. THESE STATES ARE COMMONLY REFERRED TO AS ON AND OFF, TRUE AND FALSE, HIGH AND LOW, OR "1" AND "0".
CAGE Information
Code | Company |
---|---|
54485 | MICROSEMI CORP.- MASSACHUSETTS DBA M |
Federal Supply Class
Title
MICROCIRCUITS, ELECTRONIC
Inclusions:
INCLUDES INTEGRATED CIRCUIT DEVICES; INTEGRATED CIRCUIT MODULES, INTEGRATED ELECTRONIC DEVICES: HYBRID, MAGNETIC, MOLECULAR, OPTO-ELECTRONIC, AND THIN FILM.
Exclusions:
EXCLUDES SINGLE CIRCUIT ELEMENTS SUCH AS CAPACITORS; RESISTORS; DIODES AND TRANSISTORS; PRINTED CIRCUIT BOARDS AND CIRCUIT CARD ASSEMBLIES; AND FILTERS AND NETWORKS.
Characteristics (Decoded)
MRC | Requirements Statement | Clear Text Reply |
---|---|---|
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 15.0 VOLTS MAXIMUM POWER SOURCE |
TTQY | TERMINAL TYPE AND QUANTITY | 16 PIN |
AEHX | MAXIMUM POWER DISSIPATION RATING | 1.0 WATTS |
ADAU | BODY HEIGHT | 0.260 INCHES MINIMUM AND 0.270 INCHES MAXIMUM |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-DIODE-RESISTOR LOGIC |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
CQZP | INPUT CIRCUIT PATTERN | 1 INPUT |
CBBL | FEATURES PROVIDED | HYBRID AND NEGATIVE OUTPUTS AND HERMETICALLY SEALED AND POSITIVE OUTPUTS |
TEST | TEST DATA DOCUMENT | 06481-970521 DRAWING |
CQSJ | INCLOSURE MATERIAL | METAL |
CQSZ | INCLOSURE CONFIGURATION | CAN |
CZEQ | TIME RATING PER CHACTERISTIC | 2000.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 2000.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
ADAR | BODY OUTSIDE DIAMETER | 0.598 INCHES MINIMUM AND 0.604 INCHES MAXIMUM |
CSSL | DESIGN FUNCTION AND QUANTITY | 1 DRIVER, POWER |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |