Part Number
Definition:
TWO OR MORE DIODE SEMICONDUCTOR DEVICES DESIGNED TO FUNCTION AS A UNIT IN CHANGING ALTERNATING CURRENT TO DIRECT CURRENT. THE DIODE DEVICES ARE INTERNALLY CONNECTED IN SERIES, AND ARE PERMANENTLY CASED, ENCAPSULATED, POTTED, OR MOLDED TOGETHER TO FORM AN INSEPARABLE UNIT. THESE UNITS MAY BE DESIGNED AS EITHER HALF-WAVE OR FULL-WAVE RECTIFIERS AND MAY BE MOUNTED TO FORM EITHER SINGLE PHASE OR THREE PHASE BRIDGES. FOR INTERCONNECTED ITEMS ARRANGED IN STACK(S), SEE RECTIFIER, SEMICONDUCTOR DEVICE. FOR ITEMS FABRICATED IN THE FORM OF A MONOLITHIC OR THIN FILM STRUCTURE THAT PERFORM THE FUNCTION OF A CIRCUIT, SEE INTEGRATED CIRCUIT (AS MODIFIED). EXCLUDES SEMICONDUCTOR DEVICES, UNITIZED; SEMICONDUCTOR DEVICE ASSEMBLY; AND RECTIFIER NETWORK, UNITIZED.
CAGE Information
| Code | Company |
|---|---|
| 12969 | MICRO USPD INC |
Federal Supply Class
Title
SEMICONDUCTOR DEVICES AND ASSOCI
Inclusions:
INCLUDES SEMICONDUCTOR ASSEMBLIES; SEMICONDUCTOR DIODES; SEMICONDUCTOR RECTIFIERS, SEMICONDUCTOR THYRISTORS; TRANSISTORS; UNITIZED SEMICONDUCTORS; ASSOCIATED HARDWARE EXCEPT SOCKETS.
Exclusions:
EXCLUDES MICROCIRCUITS; OPTOELECTRONIC DEVICES AND ASSOCIATED HARDWARE.
Characteristics (Decoded)
| MRC | Requirements Statement | Clear Text Reply |
|---|---|---|
| TTQY | TERMINAL TYPE AND QUANTITY | 2 PIN |
| MATT | MATERIAL | SILICON |
| TEST | TEST DATA DOCUMENT (NON-CORE) | 90536-7906203 DRAWING |
| ALAW | ABSOLUTE MAXIMUM VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 45.0 REPETITIVE PEAK REVERSE VOLTAGE |
| ABKW | OVERALL HEIGHT | 0.450 INCHES MAXIMUM |
| ABHP | OVERALL LENGTH | 1.573 INCHES MAXIMUM |
| AJUR | CIRCUIT CONNECTION STYLE DESIGNATOR | CENTER TAP 1 PHASE |
| ALAY | ABSOLUTE MAXIMUM CURRENT RATING PER CHARACTERISTIC | 300.00 AMPERES PEAK FORWARD SURGE CURRENT AND 30.00 AMPERES AVERAGE FORWARD CURRENT AVERAGED OVER A FULL 60-HZ CYCLE |
| AFGA | OPERATING TEMP RANGE | -55.0/+150.0 DEG CELSIUS |
| ABMK | OVERALL WIDTH | 1.050 INCHES MAXIMUM |
| AXGY | MOUNTING METHOD | UNTHREADED HOLE |